PHI Fellow, Dr. John Hammond, has been invited to speak at the “JaST Tribology Conference" in Tokyo, Japan, May 12-15, 2008. Dr. Hammond's Talk, entitled “The Magic of 3D Organic Film Characterization with C60 Ions Combined with XPS and TOF-SIMS”, will be part of the International Tribology Forum on May 15th, that will focus on “Boundary Communication between Nanotechnology and Tribology.” The fundamental studies on nanotribology and nanotechnology and their applications are to be discussed at the forum. The International Tribology Forum is organized by JaST as a part of the JaST annual conference.
For more information visit: www.tribology.jp/jikkou/08tokyo/08tokyo_forum2.htm
