As in previous years, Physical Electronics continues to be a proud sponsor of AVS and is supporting the 57th International Symposium and Exhibition (AVS-57) as a Platinum level sponsor. Members of our technical and sales staff will be present at our booths in the exhibition hall and participating in the technical sessions. Visit PHI at booths 300 and 301 to see the latest innovations in our XPS, AES, and SIMS systems.
PHI’s participation in the technical sessions includes many contributed talks throughout the AVS-57 conference. We hope you will have the opportunity to attend these presentations to learn about some of the latest developments at PHI. Talks by PHI include:
Tuesday, October 19, 2010 at 12:40 PM - Exhibitor Workshop Sessions: PHI Fellow, Dr. John Hammond will present A New Cluster Ion Beam for Depth Profiling Challenging Organic Materials.
Tuesday, October 19, 2010 at 4:20 PM - Applied Surface Science/Advances in Surface and Interface Imaging Session: TOF-SIMS Scientist, Dr. Greg Fisher will present From Depth Profiling to FIB Sectioning for 3D TOF-SIMS Imaging of Organics.
Tuesday, October 19, 2010 at 6:00 PM - Applied Surface Science Poster Session: Auger Scientist, Denny Paul will present Metal Silicide Nanoscale Chemical Characterization with Scanning Auger Microscopy.
Tuesday, October 19, 2010 at 6:00 PM - Surface Science Poster Session: Sr. Lab Scientist, Saad Alnabulsi will present XPS Organic Depth Profiling Analysis of Poly-glycidyl Methacrylate Brushes.
Wednesday, October 20, 2010 at 10:40 AM - Applied Surface Science/New Ion Beam Technologies for Imaging, Sample Preparation and Analysis Session: PHI Fellow, Dr. John Hammond will present XPS Comparison of Ar, Coronene, C60, and Ar Gas Cluster Ion Beam Depth Profiling of Polyimide Films.
Wednesday, October 20, 2010 at 2:20 PM - Surface Mass Spectrometry: SIMS and Beyond Session: TOF Scientist, Dr. Scott Bryan will present Optimization of C60 Sputtering Conditions for Polymer Depth Profiling by TOF-SIMS.
For more information regarding AVS-57 visit: www.avs.org
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