Microscopy & Microanalysis 2012
July 29 - August 2, 2012
Phoenix Convention Center - Phoenix, AZ
Physical Electronics is proud to attend the 2012 Microscopy and Microanalysis meeting and exhibition, July 29 – August 2, 2012 in Phoenix, Arizona. Please visit us in booth #206 to learn about our AES, XPS and TOF-SIMS surface analysis instrumentation.
Professor Fred Spada, University of California San Diego, will present Application of Surface Analytical Techniques for Understanding Deposit Formation on Magnetic Tape Recording Head Surfaces, a paper co-authored with Dennis Paul and Dr. John Hammond of Physical Electronics. We invite you to attend this talk as part of the Advances in Instrumentation Symposia, Surface and Subsurface Analysis Session, Tuesday, July 31, 9:00 a.m., Room 125A.
You can also hear Dr. John Hammond present Scanning Auger Analysis of Nanowires and Thin Film Nanostructures, a paper co-authored with Dennis Paul on Wednesday, August 1 at 10:30 a.m. in Room 125A.