Organized by the Preparation Committee of SIMS IV China / ISSIMS 08 Beijing, the 4th Chinese Conference on Secondary Ion Mass Spectrometry (SIMS China IV) and 2008 Beijing International Symposium on Secondary Ion Mass Spectrometry (ISSIMS 08 Beijing), will be held in Beijing, China from October 26th to 29th, 2008. The Conference provides a forum for mutual exchange of knowledge, technical discussions, and collaboration among SIMS communities in China as well as the rest of the world. The purpose of this meeting is to accelerate the progress of SIMS, and to promote its applications in various fields. PHI Sr. Fellow, Dr. John Hammond, will present a Talk at the Symposium entitled "Expanding TOF-SIMS Analysis with C60: from Surface Spectrometry to 3D Molecular Imaging". For more information please visit www.simsivchina.org
