The 30th Annual Symposium on Applied Surface Analysis (Surface Analysis 2008) covers all aspects of quantitative surface and thin-film analysis including instrumentation, in-situ techniques, molecular and surface chemical imaging, 3-D visualization, data reduction and analysis, sample preparation, and multi-technique approaches. Analysis of organic, biological, environmental, or wet materials, semiconductors, metals, ceramics, polymers, glasses, composites, electronic, electro-optic, photonic, electroactive, and multi-functional materials. Surface analysis of nano or micro-engineered systems and devices (NEMS and MEMS), sensor materials, catalysts, tribological systems. Application of traditional or novel electron or ion spectroscopies (XPS, AES, SIMS, ion scattering methods) and scanning probe techniques (AFM, STM, etc.) to traditional or novel materials systems. Applications of traditional or emerging techniques for surface analysis (FTIR, SFG, etc). This Symposium is co-sponsored by the Penn State Materials Research Institute and the AVS. PHI Scientist, Dr. Greg Fisher, will present two Talks at the Symposium, "Adventures Using C60 in TOF-SIMS Analysis: from Surface Spectrometry to 3D Molecular Imaging" and "3D Molecular Characterization of an in vivo Pharmaceutical Device by TOF-SIMS Imaging". Another Talk will be presented by PHI Fellow, Dr. John Hammond, entitled, "Extending the Magic of C60 Depth Profiling of Polymers with XPS".
For more information regarding this Symposium visit: http://www.mri.psu.edu/conferences/SurfaceAnalysis2008
