Surface Analysis Equipment - Physical Electronics, Inc.
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Update on ULVAC-PHI in Chigaski, Japan
April 04, 2011
MultiPak Version 9
March 03, 2011
PHI Presentation and Workshop at Drexel University
February 22, 2011
PHI Receives Product Award for the Gas Cluster Ion Beam (GCIB) source!
November 29, 2010
Introducing the Gas Cluster Ion Beam Ion Gun
November 09, 2010
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