PHI Presentation and Workshop at Drexel University
PHI Scientist, Saad Alnabulsi, conducted a seminar on "Scanning XPS Multi-technique Instrumentation - Recent Developments and Applications" on Friday, February 18, 2011, at Drexel University in Philadelphia, PA. About 50 persons were in attendance at the seminar which included an introduction to AES and XPS theory of operation followed by recent applications in small area organic and inorganic surface analysis, ultra-thin film analysis, low X-ray exposure XPS analysis, and cluster ion source sputtering for organic XPS analysis. Physical Electronics offers the only commercially available X-ray Photoelectron Spectroscopy (XPS) instruments with a focused, electronically raster scanned X-ray beam. The microprobe’s functionality has greatly expanded the application of XPS into many areas where non-homogeneous materials are commonplace. This unique capability enables the collection of x-ray beam induced secondary electron images with SEM like ease of use, a tool to detect contaminants and thin patterned chemical features that are often not visible with optical microscopes and may be incompatible with traditional electron beam induced techniques.