Event
AVS 62nd International Symposium & Exhibition
PHI is proud to be a Gold Sponsor of the AVS 62nd International Symposium & Exhibition.
BOOTH #415
PHI is proud to be a Gold Sponsor of the AVS 62nd International Symposium & Exhibition. The conference addresses cutting-edge issues associated with materials, processing, and interfaces in both the research and manufacturing communities. The week long Symposium fosters a multidisciplinary environment that cuts across traditional boundaries between disciplines, featuring papers from AVS technical divisions, technology groups, and focus topics on emerging technologies. The equipment exhibition is one of the largest in the world and provides an excellent opportunity to view the latest products. Our scientific staff will be on hand to discuss your surface analysis needs.
We invite you to stop by our booth or to attend the talks being presented by our staff:
Jennifer Mann, Ar+ and Cluster Ion Depth Profiling for Quantitative XPS Inorganic Thin Film Analysis, Monday, October 19, 10:40 am (AS-MoM-8)
Scott Bryan, What's New from Physical Electronics, Tuesday, October 20, 1:40 pm (EW-TuL-5)
John Moulder, ASSD 30th Anniversary Lecture: A Historical Perspective of the Materials Challenges and Instrumentation Solutions Available for Practical X-ray Photoelectron and Auger Electron Spectroscopy, Wednesday, October 21, 8:00 am (AS-WeM-1)
David Carr, FIB-TOF Tomography Characterization of Organic Structures, Wednesday, October 21, 3:00 pm (AS+SS-WeA-3)
Scott Bryan, Unambiguous Molecular
Identification with TOF-SIMS Imaging MS/MS, Thursday,
October 22, 4:40 pm (AS+SS-ThA-8)
For more information or to register for the conference, click here.
