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PHI Introduces the VersaProbe III

Physical Electronics announces the introduction of the VersaProbe III scanning XPS microprobe. This exciting new XPS instrument features improved technology that sets it apart from its competition as a superior instrument for a broad range of micro-area and large area XPS applications.

Notable changes include improvements to the analyzer and detector technologies that increase detection efficiency by a factor of 2-3 times for all analysis conditions, a new Ar gas cluster ion gun, and new sample handling options.  The new sample handling accessories provide expanded capabilities for obtaining XPS measurements over a broader range of temperatures and provide the ability to perform in-situ controlled potential studies.

For additional information about the VersaProbe III or other PHI instruments please view the Product pages on our website or contact your PHI sales representative.