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Physical Electronics Introduces the PHI nanoTOF

At the 53rd meeting of the American Vacuum Society, Physical Electronics will introduce its new nanoTOF Time-of Flight Secondary Ion Mass Spectrometer.

At the 53rd meeting of the American Vacuum Society, Physical Electronics will introduce its new nanoTOF  Time-of Flight Secondary Ion Mass Spectrometer.  A product of the joint Physical Electronics and ULVAC-PHI development teams the nanoTOF offers revolutionary new sample handling capabilities and superior ion gun performance characteristics that combined with PHI’s patented TRIFT mass spectrometer design deliver superior performance for a broad range of TOF-SIMS applications.

To learn more about the nanoTOF visit the products section of this website or contact your local sales representative.