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The PHI TRIFT V nanoTOF at SAIF/RSIC, IIT, Bombay

The PHI TRIFT V nanoTOF Time-of-Flight Secondary Ion Mass Spectrometer (Tof-SIMS) is now commissioned at the Indian Institute of Technology (IIT), Bombay, in the Sophisticated Analytical Instrument Facility (SAIF), formerly known as the Regional Sophisticated Instrumentation Centre (RSIC). The PHI TRIFT V nanoTOF is the first instrument of its kind in India. The new instrument is the latest generation of PHI's surface analysis line of ToF-SIMS instruments, utilizing a newly developed, high-quality "TRIFT" analyzer. SAIF/RSIC, is a non-commercial lab facility founded in 1976 that houses a variety of major analytical instruments which are operated and maintained by a dedicated and qualified group of Scientists and Engineers with a vision to be among the top analytical instrument laboratories in the world. PHI is proud to have the TRIFT V nanoTOF in the SAIF facility as part of achieving this goal.

SAIF, IITB