News & Articles
June 6, 2024
Multi-Technique Characterization of PtNi Nanowires for Enhanced Durability and Efficiency
May 13, 2024
XPS Insights into Chemical Degradation Mitigation of Protective Coatings on NCM Cathodes
May 6, 2024
Exploring the Power of TOF-SIMS by Coupling Collision-Induced Dissociation with Surface-Induced Dissociation for Structural Analysis
February 21, 2024
XPS Insights of Fluorinated Ether Electrolyte for High Voltage Li Metal Batteries
February 7, 2024
Surface Analysis Spotlight Part 4: Concluding Perspectives on Advanced Thin Film Characterization via StrataPHI 2.0 Software
December 12, 2023
Surface Science Discoveries: Using TOF-SIMS in Quantum Computing & Battery Innovation
December 4, 2023
Surface Analysis Spotlight Part 3: What Range of Film Thickness Can StrataPHI Calculate from Angle-Resolved XPS and HAXPES Spectra?
18725 Lake Drive East,
Chanhassen, MN 55317
© 2024 Physical Electronics, Inc. (PHI)
All Rights Reserved.
© 2024 Physical Electronics, Inc. (PHI)
All Rights Reserved.