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  • PHI 700 Auger Nanoprobe
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    • Die Navigation Module
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  • PHI nanoTOF TOF-SIMS
  • PHI ADEPT-1010 D-SIMS
  • Used PHI Equipment
Related Techniques
  • AES
Application Notes
  • Characterizing Electrically Isolated Bond Pad Surfaces
  • Characterizing Nano-Scale Precipitates in Steel
  • High Spatial Resolution Auger Imaging
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PHI 700 Auger Nanoprobe

Application Notes

  • Characterizing Electrically Isolated Bond Pad Surfaces
  • Characterizing Nano-Scale Precipitates in Steel
  • High Spatial Resolution Auger Imaging
  • High Spatial Resolution Auger Imaging of Highly Topographic Samples
  • Fracture Analysis of an Embrittled Low Alloy Steel Rotor Blade from an Operating Steam Turbine
  • Auger Analysis of Boron Oxide Crystals Formed by CBN Chemical Vapor Deposition (CVD)
  • Using Low Energy Ions for Charge Neutralization in Scanning Auger Nanoprobes
  • Optimized Depth Resolution with Low Voltage Sputtering and Zalar Rotation
  • TiN Composition Measurements by Auger Electron Spectroscopy
  • Compucentric Zalar Profile of a 10 μm Al Pad Using the PHI 680 Scanning Auger Nanoprobe
  • Defect Navigation on Wafer Pieces with the PHI 700 Auger Nanoprobe
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Surface Analysis Instruments and Equipment