3D Polymer Film Depth Profiling

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A PHI nanoTOF equipped with a unique C60 cluster source ion gun can be used to depth profile many polymer and organic thin film structures and provide high sensitivity for the detection of molecular species. Shown below is a 3D analysis of an Irganox 1010 film that contains multiple thin layers of Irganox 3114. The 3D iso-surface display shows the Irganox 1010 layers in red and the thin (delta) layers of Irganox 3114 in green.

20 kV C60 depth profile of an irganox delta layer sample showing the presence of four well defined delta layers of Irganox 3114.

Sample courtesy of Alex Shard, National Physical Laboratory, England