Magnetic Storage Media

Contact

PHI XPS, AES, and TOF-SIMS instruments can be used to confirm or explore the construction of magnetic storage media and many other thin film structures. Shown below is an XPS sputter depth profile obtained using a monatomic argon ion source for sputtering. Note the ability to observe multiple ultra thin layers of varying composition and observe the presence of oxygen at a few of the interfaces.

Sputter Depth Graph

XPS sputter depth profile of a magnetic storage disk obtained using monatomic argon for sputtering.