PHI nanoTOF TOF-SIMS

Application Notes

• 3D Imaging of a CMOS Device
• Accurate Determination of Elemental Contamination on Wafer Surfaces
• Analysis of Alq3 OLED Materials
• Monitoring Elemental Contaminants on Semiconductor Product Wafers
• PHI WinCadence Compound Identification Tool
• Radial Distribution of Copper Contamination on the Surface of a Polished Silicon Wafer
• SIMS Enhancement of Molecular Ion Yields Using a Gold LMIG
• Surface Metal Contmination on Patterned Wafers
• Time of Flight Secondary Ion Mass Spectrometry
• TOF SIMS Analysis of a Drug Pellet Cross Section
• TOF SIMS Analysis of a Hard Disk
• TOF SIMS Analysis of a Pesticide Treated Leaf
• TOF SIMS Analysis of a Pole Tip Gap
• TOF SIMS Analysis of PDMS
• TOF SIMS Analysis of Polystyrene Oligomer Distributions
• TOF SIMS Analysis of Semiconductor Device Vias
• TOF SIMS Characterization of Multi-Layer Paint Coatings
• TOF SIMS Detection of High Mass Oligomers
• TOF SIMS High Mass Resolution
• TOF SIMS Imaging of a Paint Cross Section
• TOF SIMS Imaging of Insulating Organic Samples with High Top
• TOF SIMS Imaging of Molybdenum Oxide Powders
• TOF SIMS Imaging of Rough Surfaces
• TOF-SIMS Analysis of the Glass Phase in AZS Materials
• TOF-SIMS Molecular Imaging of a Micropatterned Biological Ligand
• Molecular Imaging of Micron Scale Features
• Large Area (Mosaic) C60+ Imaging by TOF-SIMS
• Chemical Imaging at the Interface of a Bulk Elastomer Laminate
• 3D Imaging of a Pharmaceutical Coating Using TOF-SIMS
• Adjustable Height Sample Holder
• Imaging Additives on Human Hair with the PHI nanoTOF
• Chemical Imaging of Particles with the PHI nanoTOF
• 3D FIB-TOF Imaging the Microstructure of an Alloy