PHI nanoTOF TOF-SIMS
Application Notes
- Differentiation-of-the-Epicuticular-Waxes-on-the-Surface-of-Arabidopsis-Organs
- 3D FIB-TOF Imaging the Microstructure of an Alloy
- Optimizing-C60-Incidence-Angle-for-Polymer-Depth-Profiling-by-TOF-SIMS
- Imaging Additives on Human Hair with the PHI nanoTOF
- Chemical Imaging of Particles with the PHI nanoTOF
- Large Area (Mosaic) C60+ Imaging by TOF-SIMS
- 3D Imaging of a CMOS Device
- 3D Imaging of a Pharmaceutical Coating Using TOF-SIMS
- Chemical Imaging at the Interface of a Bulk Elastomer Laminate
- TOF-SIMS Molecular Imaging of a Micropatterned Biological Ligand
- Adjustable Height Sample Holder
- SIMS Enhancement of Molecular Ion Yields Using a Gold LMIG
- Analysis of Alq3 OLED Materials
- Accurate Determination of Elemental Contamination on Wafer Surfaces
- Monitoring Elemental Contaminants on Semiconductor Product Wafers
- PHI WinCadence Compound Identification Tool
- Radial Distribution of Copper Contamination on the Surface of a Polished Silicon Wafer
- Surface Metal Contamination on Patterned Wafers
- Time of Flight Secondary Ion Mass Spectrometry
- TOF SIMS Analysis of a Drug Pellet Cross Section
- TOF SIMS Analysis of a Hard Disk
- TOF SIMS Analysis of a Pesticide Treated Leaf
- TOF SIMS Analysis of a Pole Tip Gap
- TOF SIMS Analysis of PDMS
- TOF SIMS Analysis of Polystyrene Oligomer Distributions
- TOF SIMS Analysis of Semiconductor Device Vias
- TOF SIMS Characterization of Multi-Layer Paint Coatings
- TOF SIMS Detection of High Mass Oligomers
- TOF SIMS High Mass Resolution
- TOF SIMS Imaging of a Paint Cross Section
- TOF SIMS Imaging of Insulating Organic Samples with High Top
- TOF SIMS Imaging of Molybdenum Oxide Powders
- TOF SIMS Imaging of Rough Surfaces
- TOF-SIMS Analysis of the Glass Phase in AZS Materials
- Molecular Imaging of Micron Scale Features
