PHI 700Xi Scanning Auger Nanoprobe
Application Notes
- Characterizing Electrically Isolated Bond Pad Surfaces
- Characterizing Nano-Scale Precipitates in Steel
- High Spatial Resolution Auger Imaging
- High Spatial Resolution Auger Imaging of Highly Topographic Samples
- Fracture Analysis of an Embrittled Low Alloy Steel Rotor Blade from an Operating Steam Turbine
- Auger Analysis of Boron Oxide Crystals Formed by CBN Chemical Vapor Deposition (CVD)
- Using Low Energy Ions for Charge Neutralization in Scanning Auger Nanoprobes
- Optimized Depth Resolution with Low Voltage Sputtering and Zalar Rotation
- TiN Composition Measurements by Auger Electron Spectroscopy
- Compucentric Zalar Profile of a 10 μm Al Pad Using the PHI 680 Scanning Auger Nanoprobe
- Application for EBSD Option
- Defect Navigation on Wafer Pieces with the PHI 700 Auger Nanoprobe
