PHI Quantera II Scanning XPS Microprobe

Application Notes

• Identifying Organic Defects
• Identifying Stains on Packaging Materials
• Determining Solder Ball Surface Chemistry
• Characterizing Bumped Wafers
• Full Wafer Surface Composition Maps
• Hard Disk Surface Composition Maps
• Automated QC Analysis: Silicone Detection
• PHI Model 06-C60 C60 Sputter Ion Gun Package
• Cleaning Polymer Surfaces with the PHI 06-C60 Sputter Ion Gun
• Mapping Motor Oil Additives on a Cam Shaft Lobe
• Micro-XPS of Contamination on Read/Write Heads
• Characterizing a Block Copolymer Surface
• Thin Film Analysis of Polymer Additive Migration Using the PHI Model 06-C60 Sputter Ion Gun
• Depth Profiling Organic Films with the PHI 06 C60 Sputter Ion Gun
• Micro Area XPS Depth Profiling