Surface Analysis Equipment - Physical Electronics, Inc.

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XPS

Application Notes

20 Kv C60 Depth Profiling Of Polystyrene
C60 Polymer Additive Migration
Chemical Imaging With PHI XPS Microprobes

PHI VersaProbe II Scanning XPS Microprobe

Application Notes

20 Kv C60 Depth Profiling Of Polystyrene
C60 Polymer Additive Migration
Chemical Imaging With PHI XPS Microprobes
Cleaning Polymer Surfaces With The PHI-06 C60 Sputte
Determining Solder Ball Surface Chemistry
Organic Depth Profiling With The PHI-06 C60 Sputteri
XPS Profiling Of Organic PV Films

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Surface Analysis Instruments and Equipment