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August 19, 2009

New National Nano Surface Characterization Facility (NNSCF) in South Africa features PHI Instruments

New National Nano Surface Characterization Facility (NNSCF) in South Africa features PHI Instruments.

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June 12, 2009

SWAGELOK CENTER FOR SURFACE ANALYSIS OF MATERIALS, CWRU installs PHI TRIFT V nanoTOF

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February 04, 2008

PHI European User Meeting

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February 20, 2007

Auger Analysis of Stardust at Washington University

Installation of PHI 700 System in Lab for Space Sciences at Washington University in St. Louis.

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November 12, 2006

Physical Electronics Introduces the PHI nanoTOF

At the 53rd meeting of the American Vacuum Society, Physical Electronics will introduce its new nanoTOF Time-of Flight Secondary Ion Mass Spectrometer.

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