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December 08, 2020

Formation of Stable Metal Halide Perovskite/Perovskite Heterojunctions

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December 02, 2020

Surface Analysis Spotlight - Complementary XPS and TOF-SIMS

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November 25, 2020

Surface Analysis Spotlight: Binding Energy Referencing for Insulating Samples

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November 12, 2020

New Application Note - Elemental Nano-Volume Characterization of ALD Defect Particles

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November 05, 2020

Surface Analysis Spotlight - Surface Magnifying and Identifying Buried Layers Using In Situ Angle-lapped FIB and AES

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© 2021 Physical Electronics, Inc. (PHI) All Rights Reserved.