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2019 PHI Data Reduction Software Training and User Meeting Registration

EVENT REGISTRATION        SOFTWARE TRAINING INFORMATION SHEET

PHI 2019 USER MEETING AND SOFTWARE TRAINING       

It is our great pleasure to announce that our next PHI User Meeting and Data Reduction Software Training has been scheduled for September 10-13, 2019 at the Country Inn & Suites Hotel in Chanhassen, MN!  After the last User Meeting in Germany, we are back in the US at the home of Physical Electronics USA to help celebrate our 50th Anniversary!

User Meeting – Tuesday and Wednesday, September 10-11

As in previous meetings, we will provide a platform to stimulate the exchange of information and ideas. PHI will present recent news about our products along with recent applications and upgrades. In addition, and equally important, are your contributions to the meeting. We would like to invite you to share a short 10 - 15-minute presentation about your research and your experiences using PHI equipment. Topics could be surface analysis applications or features or protocols you have developed for your system that would be of interest to other users. The meeting will cover all techniques supported by PHI including XPS, HAXPES, Auger, and Time-of-Flight SIMS.

PHI Software Training – Thursday, Sept 12

The User Meeting we will be followed by Data Reduction software training for XPS MultiPak, Auger MultiPak, and TOF-SIMS TOF-DR. To make the training most effective, the XPS training class will be limited to 15 people and 8 people for the TOF-SIMS and Auger training classes. Registrations will be accepted on a first come – first serve basis. For more details on the software training, please read through the SOFTWARE TRAINING INFORMATION SHEET.

Eigenvector Research Software Training using PLS Toolbox for Advanced Multivariate Analysis – Friday, Sept 13

For those interested in multivariate analysis of TOF-SIMS data, on Friday, Eigenvector Research (https://eigenvector.com/)  will present a one-day workshop on their PLS Toolbox software package.  Registration for this workshop is also limited to 15 attendees.

Online registration for the User Meeting and the software training classes is available now. REGISTER HERE

Hotel reservations can be made online by going to www.countryinn.com/chanhassenmn  by using the promotional code “PHELEC”, please click on “More Search Option” or by calling (800) 830-5222 and mentioning “PHELEC” as the Booking Code. Reservations must be made by August 10, 2019, in order to receive the Group Rate.

Current Agenda

Customer Presentations

Keynote Speaker - Donald Baer, Pacific Northwest National Laboratory - Parallel Universes: 50 Years in the Evolution of Research and in the Development of Analytical Instruments for Physical and Chemical Measurements

Juliet Jamtgaard, Stanford University - Research Examples Using PHI Instruments at Stanford

Perry Spivack, W.L. Gore & Associates - Tips for Optimizing & Simplifying Setting Up XPS Survey Scan & HR Scan

Prem Thapa, University of Kansas - XPS Characterization Techniques

Jenny Hedlund Orbeck, University of Madison-Wisconsin - Transformations of Complex Metal Oxide and Phosphate

Keith White, Los Alamos National Laboratory - XPS Spectra of Plutonium Oxides

Derrick Poirier, 3M - Applications of XPS at 3M

Bharat Jalan, University of Minnesota - Growing Oxide Thin Films

Jean François Veyan, University of Texas at Dallas - Carbon on Diamond, A New Insight

Kerriann Koehler, University of Clemson - XPS & UPS characterization of Chemical Composition & Electrical Properties at Silicon Nanostructure Interfaces

Physical Electronics Presentations

Scott Bryan, President Physical Electronics USA - Physical Electronics, USA Company Update

Kateryna Artyushkova, PHI Senior Staff Scientist - Reflection Electron Energy Loss Spectroscopy (REELS) & Angle-Dependent XPS Analysis of Graphene

John Newman, Director PHI Analytical Lab - XPS Charge Neutralization

Gregory L. Fisher, PHI Principal Scientist - Industrial Applications of TOF-SIMS Tandem MS (MS/MS) Imaging: Identification of Process Chemistry and Contamination with Specific Resolution of Molecular Structure and Surface Bonding

Ben Schmidt, PHI Staff Scientist - Depth Profiling: Best Beam for Specific Applications

Ashley Ellsworth, PHI Staff Scientist - Multi-technique Auger with PHI 710

Jennifer Mann, PHI Staff Scientist - HAXPES on the PHI Quantes

Evaristo Contestabile, Director Sales & Marketing - PHI Instrument Upgrades & MultiPak Software Updates

Ben Schmidt, PHI Staff Scientist - Low Energy Inverse Photoemission Spectroscopy (LEIPS) & Ultraviolet Photoelectron Spectroscopy (UPS)

Jennifer Mann, PHI Staff Scientist - Progress in Software Development; Advances in Automated Data Acquisition

Kateryna Artyushkova, PHI Senior Staff Scientist - Progress in Software Development; Advances in Data Analysis