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2019 PHI Data Reduction Software Training and User Meeting Registration

EVENT REGISTRATION        SOFTWARE TRAINING INFORMATION SHEET

PHI 2019 USER MEETING AND SOFTWARE TRAINING       

It is our great pleasure to announce that our next PHI User Meeting and Data Reduction Software Training has been scheduled for September 10-13, 2019 at the Country Inn & Suites Hotel in Chanhassen, MN!  After the last User Meeting in Germany, we are back in the US at the home of Physical Electronics USA to help celebrate our 50th Anniversary!

User Meeting – Tuesday and Wednesday, September 10-11

As in previous meetings, we will provide a platform to stimulate the exchange of information and ideas. PHI will present recent news about our products along with recent applications and upgrades. In addition, and equally important, are your contributions to the meeting. We would like to invite you to share a short 10 - 15-minute presentation about your research and your experiences using PHI equipment. Topics could be surface analysis applications or features or protocols you have developed for your system that would be of interest to other users. The meeting will cover all techniques supported by PHI including XPS, HAXPES, Auger, and Time-of-Flight SIMS.

PHI Software Training – Thursday, Sept 12

The User Meeting we will be followed by Data Reduction software training for XPS MultiPak, Auger MultiPak, and TOF-SIMS TOF-DR. To make the training most effective, the XPS training class will be limited to 15 people and 8 people for the TOF-SIMS and Auger training classes. Registrations will be accepted on a first come – first serve basis. For more details on the software training, please read through the SOFTWARE TRAINING INFORMATION SHEET.

Eigenvector Research Software Training using PLS Toolbox for Advanced Multivariate Analysis – Friday, Sept 13

For those interested in multivariate analysis of TOF-SIMS data, on Friday, Eigenvector Research (https://eigenvector.com/)  will present a one-day workshop on their PLS Toolbox software package.  Registration for this workshop is also limited to 15 attendees.

Online registration for the User Meeting and the software training classes is available now. REGISTER HERE

Hotel reservations can be made online by going to www.countryinn.com/chanhassenmn  by using the promotional code “PHELEC”, please click on “More Search Option” or by calling (800) 830-5222 and mentioning “PHELEC” as the Booking Code. Reservations must be made by August 10, 2019, in order to receive the Group Rate.

User Meeting Agenda

Day 1: Tuesday, September 10, 2019

9:00 AM Welcome John Newman/ Evaristo
Meeting Logistics
Introduction of PHI Staff 
Review of “Topics of Interest” 
9:15 AM PHI Company Update  PHI Talk Scott Bryan
9:30 AM Tips for Optimizing & Simplifying Setting up XPS Survey Scan & HR Scan W.L. Gore & Associates Perry Spivack
9:50 AM Reflection Electron Energy Loss Spectroscopy (REELS) & Angle-Dependent XPS Analysis of Graphene PHI Talk Kateryna Artyushkova
10:10 AM Coffee Break
10:40 AM XPS Charge Neutralization PHI Talk John Newman
11:00 AM Characterization Techniques University of Kansas Prem Thapa
11:20 AM XPS Spectra of Plutonium & Plutonium Oxides Los Alamos National Laboratory Keith White
11:40 AM Auger Electron Spectroscopy (AES) on Plutonium Los Alamos National Laboratory Robert Sykes
12:00 PM LUNCH
1:30 PM Industrial Application of TOF-SIMS Tandem MS Imaging (MS/MS) PHI Talk Greg Fisher
1:50 PM Transformations of Complex Metal Oxide and Phosphate University of Wisconsin Jenny Hedlund Orbeck
2:10 PM Multi-Technique Auger with PHI 710 PHI Talk Ashley Ellsworth
2:30 PM Coffee Break
3:00 PM Research Examples Using PHI Instruments @ Stanford Stanford University Juliet Jamtgaard
3:20 PM Depth Profiling: Best Beam for Specific Applications PHI Talk Ben Schmidt
3:40 PM Surface Analysis of Medical Devices Medtronic Bill Theilacker
4:00 PM Applications of XPS at 3M 3M Derrick Poirier
4:20 PM Speciation of Rare Earth elements on Clay with XPS Virginia Tech University Xu Feng
4:40 PM TOF-SIMS Imaging Biological Tissue Sections: Challenges & Opportunities Penn State University Sebastiaan Van Nuffel
5:30 PM Depart for Entertainment Event - Bakken Museum Dinner/Drinks
7:30 PM Parallel Universes: 50 Years in the Evolution of Research and in the Development of Analytical Instruments for Physical and Chemical Measurements Key Note Presentation Don Baer
10:30 PM Return to Hotel

 Day 2: Wednesday, September 11th, 2019

9:00 AM Welcome (back) & Logistics John Newman/ Evaristo
9:10 AM XPS and UPS characterization of chemical composition and electrical properties at silicon nanostructure interfaces Clemson University Kelliann Koehler
9:30 AM HAXPES on the PHI Quantes PHI Talk Jennifer Mann
9:50 AM Carbon on Diamond, A New Insight University of Texas at Dallas Jean François Veyan
10:10 AM Coffee break
10:40 AM Progress in Software Development: Advances in Data Analysis & Automated Data Acquisition PHI talk Kateryna Artyushkova & Jennifer Mann
11:00 AM Growing Oxide Thin Films University of Minnesota Bharat Jalan
11:20 AM Low Energy Inverse Photoemission Spectroscopy (LEIPS) & Ultraviolet Photoelectron Spectroscopy (UPS) PHI Talk Ben Schmidt
11:40 AM Mimic Dual Charge Neutralization using the Flood Gun and Ion Gun on 5600 National Energy Technology Labs John Baltrus
12:00 PM PHI Instrument Upgrades & MultiPak Software Updates PHI Talk  Evaristo Contestabile
12:20 PM Wrap-up- Summary
12:30 PM LUNCH
1:30 PM - 3:30 PM Optional - PHI Demo Lab Tours at Physical Electronics John Newman/Lab Scientists
5:30 PM Optional - Nationals vs Twins Baseball game (tickets upon request only) (6:40 PM) 
End of the 2019 User Meeting