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New Application Note - Complementary XPS and TOF-SIMS for Organic Analysis

Complementary XPS and TOF-SIMS for Organic Analysis

Complementary XPS and TOF-SIMS for Organic Analysis

For the characterization of polymers and organic-coated surfaces, the combination of two surface sensitive techniques - X-ray Photoelectron Spectroscopy (XPS) and Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) can be extremely powerful.  XPS provides quantitative analysis and short-range bonding chemistry from elements on the outermost surface while TOF-SIMS can provide the molecular information needed to positively identify organic species and the spatial resolution needed to show their lateral distributions on the sample surface.  This application note discusses the complementary attributes of XPS and TOF-SIMS and demonstrate how combining the two is essential to more fully understand organic surfaces.

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© 2020 Physical Electronics, Inc. (PHI) All Rights Reserved.