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AVS 65 Lunch n Learn - Complementary XPS & TOF-SIMS

Physical Electronics would like to invite you to our Lunch n Learn event at AVS 65 in Long Beach, CA. 

WHAT: Complementary XPS & TOF SIMS Analysis presented by John Newman

WHERE: Hyatt Regency Long Beach - Beacon Ballroom (200 S Pine Ave, Long Beach, CA 90802) AVS Headquarter Hotel next to convention center

WHEN: Wednesday, October 24 from 12:30pm-1:30pm - Lunch will be provided 

The space has limited room so the event is limited to the first 40 people to RSVP. If you'd like to reserve your spot for the event, please RSVP to bellefson@phi.com as soon as possible.

For the characterization of polymers and organic-coated surfaces, the combination of two surface sensitive techniques - X-ray Photoelectron Spectroscopy (XPS) and Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) can be extremely powerful.  XPS provides quantitative analysis and short-range bonding chemistry from elements on the outermost surface while TOF-SIMS can provide the molecular information needed to positively identify organic species and the spatial resolution needed to show their lateral distributions on the sample surface.  This presentation will discuss the complementary attributes of XPS and TOF-SIMS and demonstrate how combining the two is essential to more fully understand organic surfaces.

We look forward to seeing you there!