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Accurate and reproducible in-depth observation of organic–inorganic hybrid materials using FIB-TOF-SIMS

In this article from American Vacuum Society, a few PHI scientists are featured. Please follow the link below to see the full article.

Accurate and reproducible in-depth observation of organic–inorganic hybrid materials using FIB-TOF-SIMS

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© 2020 Physical Electronics, Inc. (PHI) All Rights Reserved.
© 2020 Physical Electronics, Inc. (PHI) All Rights Reserved.