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Formation of Stable Metal Halide Perovskite/Perovskite Heterojunctions

New collaborative paper with Professor Russel Holmes at the University of Minnesota on “Formation of Stable Metal Halide Perovskite/Perovskite Heterojunctions”

XPS profiling was among multiple characterization methods to study heterojunctions between two metal halide perovskite layers.
 

 XPS depth profiling using a C60 sputtering source has shown to be particularly useful for perovskites as it offers the advantages of C60 for mixed organic/inorganic materials coupled with XPS’s inherent sensitivity to different bonding environments.

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© 2021 Physical Electronics, Inc. (PHI) All Rights Reserved.