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Surface Analysis Spotlight: Using TOF-SIMS Tandem Mass Spectrometry to Determine the Surface Bonding in a Monolayer Film

Surface Analysis Spotlight on the identification of chemical bonding in (sub-)monolayer films by Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) tandem MS imaging.

Using TOF-SIMS Tandem Mass Spectrometry to Determine the Surface Bonding in a Monolayer Film

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© 2021 Physical Electronics, Inc. (PHI) All Rights Reserved.
© 2021 Physical Electronics, Inc. (PHI) All Rights Reserved.