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Surface Analysis Spotlight: Which Higher Energy X-ray Source is the Most Beneficial for Laboratory HAXPES Measurements

Educational Series

This spotlight discusses the advantage of Cr X-ray source over others, especially when the goal of the analysis is to study buried interfaces and layers without the worry of ion beam damage during sputter depth profiles.

Which Higher Energy X-ray Source is the Most Beneficial for Laboratory HAXPES Measurements

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© 2021 Physical Electronics, Inc. (PHI) All Rights Reserved.
© 2021 Physical Electronics, Inc. (PHI) All Rights Reserved.