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News & Articles

June 1, 2023

Characterization of cathode-electrolyte interface in all-solid-state batteries using AES, TOF-SIMS, XPS, and UPS/LEIPS

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May 15, 2023

HAXPES of GaN  Interface in MOS High Electron Mobility Transistors

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May 8, 2023

Artificial Intelligence (AI) Provides Ease-of-Use in TOF-SIMS Data Reduction

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May 3, 2023

Additive Manufacturing Materials

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February 15, 2023

Impact of PHI Auger instruments on scientific discovery

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February 7, 2023

Impact of PHI XPS instruments on scientific discovery

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November 16, 2022

In Memory of Paul Larson

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November 7, 2022

Announcing the NEW PHI Genesis - No Compromise!!

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November 2, 2022

Toward Clinical and Intraoperative Viability of Fast MS Imaging

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© 2024 Physical Electronics, Inc. (PHI) All Rights Reserved.