Article
New National Nano Surface Characterization Facility (NNSCF) in South Africa features PHI Instruments
New National Nano Surface Characterization Facility (NNSCF) in South Africa features PHI Instruments.
August 19, 2009
The Department of Physics at the University of the Free State in Bloemfontein, South Africa, recently received two instruments, the PHI 700 Scanning Auger Nanoprobe and the PHI 5000 XPS Versaprobe. These instruments will mainly be used for nanotechnology and contract research for the New National Nano Surface Characterization Facility (NNSCF) at the University. To learn more about this exciting work, click on the link below which will take you to the University of the Free State website.
18725 Lake Drive East,
Chanhassen, MN 55317
© 2024 Physical Electronics, Inc. (PHI)
All Rights Reserved.
© 2024 Physical Electronics, Inc. (PHI)
All Rights Reserved.