Nanoscale Surface Sensitive Chemical Imaging of Additive Manufacturing Materials Webinar by Auger Electron Spectroscopy

Presented by Ashley Maloney, Ph.D., Senior Staff Scientist

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Additive manufacturing is an ever-growing area of research interest that depends upon the high quality of precursor materials in order to achieve a robust final printed product. In this work, an alloy powder material of CuCrZr used in the laser-powder bed diffusion process of 3D printing will be analyzed for grain boundary diffusion and for chemical variation among different particle sizes. Recent advances in Auger Electron Spectroscopy, including in situ FIB capabilities, put AES at the forefront of surface analysis techniques with respect to characterization of such defects on the nanoscale. The quantitative elemental information AES provides from solid surfaces combined with FIB tomography allows for in situ cross-sectioning and subsequent elemental characterization of the CuCrZr powder particles. The variation of chemistry across different sized particles will also be assessed via quantitative chemical analysis using XPS.

Figure 1. SEM images (row a) of a FIB cross-section of a CuCrZr powder particle at 20 µm, 10 µm, and 5 µm field of view and elemental Auger maps (row b) at 3 µm field of view.

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