AVS 66th International Symposium and Exhibition

Physical Electronics is happy to be a sponsor at the AVS 66th International Symposium and Exhibition in Columbus, Ohio.

Along with our Booth (#500), Physical Electronics will have many talks and posters being presentated throughout the week. Below you can find a schedule of the presentations being given:

 Monday, Oct. 21, 10:40 AM, AS - “Misinterpretations in the Spectroscopic Analysis of Heterogeneous Materials and Defected Structures”, L. Swartz

Tuesday, Oct. 22, 2:00 PM, Exhibitor Talks - “What’s New at PHI”, J. Newman

Tuesday, Oct. 22, 5:00 PM, AS - “Characterization of Electronic Materials using Low Energy Inverse Photoemission Spectroscopy”, B. Schmidt

Thursday, Oct. 24, 8:40 AM, AS - ”TOF-SIMS Tandem MS Imaging of (Sub-)Monolayer Coatings for Device Processing”, D.M.Carr

Thursday, Oct. 24, 12:00 PM, AS - “Multi-technique Surface Analysis of Graphenes”, K. Artyushkova

Thursday Post Session - “Using AES, EDS, and FIB to Detect, Identify, and Image Buried Metallic Particles”, A. Ellsworth

Thursday Poster Session - “XPS, TOF-SIMS, and AES Analysis of Fresh and Aged Alumina-Supported Silver Catalysts”, J. Newman

Short course “Essentials of Accurate and Reliable Surface Analysis using X-ray Photoelectron Spectroscopy (XPS) and Auger Electron Spectroscopy (AES)”: taught by K. Artyushkova, Wednesday, register: https://avsny.wufoo.com/forms/m1gb3gy81659xg6/

More information will become available as we near the event, but please visit the AVS 66 website to find information now.