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Complementary Electron Spectroscopy Techniques in Surface Analysis

 

UT Austin and Physical Electronics are pleased to cohost an Electron Spectroscopy seminar on Tuesday, January 29th 2019, 11:00 am – 12:00 pm, in the Engineering and Education Research Center (EER) / Room 3.640.

Attendance is free, and refreshments will be available.

There are several electron spectroscopy techniques that are used today in surface analysis, and each has its unique advantage. To successfully characterize a given surface, the combination of two or more surface sensitive techniques can be extremely powerful, and when coupled together, the can aid in comprehensively solving problems and answer questions.

X-ray Photoelectron Spectroscopy (XPS) and Auger Electron Spectroscopy (AES) provide quantitative analysis and chemical state information from the outermost layer of the surface, while Ultraviolet  Photoelectron Spectroscopy (UPS), Electron Energy Loss and Inverse Photoemission can provide molecular and structural information of the sample surface. The presentation will briefly review basics of these various techniques, and application examples will highlight the benefit of combining multiple in-situ techniques to more fully understand surface composition.

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