Event

As in previous years, Physical Electronics continues to be a proud sponsor of AVS and is supporting the 57 ^th International Symposium and Exhibition (AVS-57) as a Platinum level sponsor. Members of our technical and sales staff will be present at our booths in the exhibition hall and participating in the technical sessions. Visit PHI at booths 300 and 301 to see the latest innovations in our XPS, AES, and SIMS systems including:

The NEW Quantera II Scanning XPS Microprobe

The Quantera II is built upon the revolutionary technologies Physical Electronics (PHI) introduced with the Quantum 2000 including: a patented micro-focused scanning x-ray source, patented dual beam charge neutralization technology, a floating column ion gun for XPS sputter depth profiling, flexible robotic sample handling, and a fully automated internet ready instrument platform. The Quantera II increases the performance and productivity of these revolutionary technologies, providing the highest performance XPS system available to meet your current and future XPS needs.

The NEW PHI 4700 Automated Auger Depth Profiler

The PHI 4700 Thin Film Analyzer provides a powerful automated depth profiling capability utilizing Auger Electron Spectroscopy. The PHI 4700 consists of a high sensitivity hemispherical analyzer, a 10 kV LaB ₆ scanning electron gun, a 5 kV floating column argon ion gun, and a precision automated sample stage. The PHI 4700 is a complementary instrument to our high performance PHI 700Xi scanning Auger Nanoprobe. It provides a highly automated, cost effective solution for routine Auger depth profiling and micro-area failure analysis.

NEW Gas Cluster Ion Gun

A compliment to our C ₆₀ cluster ion guns, PHI’s new Ar Gas Cluster Ion Gun has been shown to be effective for sputtering polymers such as polyimides that do not sputter well with C ₆₀ or Coronene. to learn more about this new technology please attend the AVS Exhibitor Workshop (details below).

PHI’s participation in the technical sessions includes many contributed talks throughout the AVS-57 conference. We hope you will have the opportunity to attend these presentations to learn about some of the latest developments at PHI. Talks by PHI include:

Sunday, October 17, 2010 at 2:00 PM - ASTM and ASSD Workshop on Two is Company, Three is a Crowd, but How Many is a Cluster?   Dr. John Hammond will participate in panel presentations on cluster ion guns.

Tuesday, October 19, 2010 at 12:40 PM - Exhibitor Workshop Sessions: Dr. John Hammond will present A New Cluster Ion Beam for Depth Profiling Challenging Organic Materials . 

Tuesday, October 19, 2010 at 4:20 PM - Applied Surface Science/Advances in Surface and Interface Imaging Session: TOF-SIMS Scientist, Dr. Greg Fisher will present From Depth Profiling to FIB Sectioning for 3D TOF-SIMS Imaging of Organics .

Tuesday, October 19, 2010 at 6:00 PM - Applied Surface Science Poster Session: Auger Scientist, Denny Paul will present Metal Silicide Nanoscale Chemical Characterization with Scanning Auger Microscopy .

Tuesday, October 19, 2010 at 6:00 PM - Surface Science Poster Session: Sr. Lab Scientist, Saad Alnabulsi will present XPS Organic Depth Profiling Analysis of Poly-glycidyl Methacrylate Brushes.

Wednesday, October 20, 2010 at 10:40 AM - Applied Surface Science/New Ion Beam Technologies for Imaging, Sample Preparation and Analysis Session: Dr. John Hammond will present XPS Comparison of Ar, Coronene, C ₆₀ , and Ar Gas Cluster Ion Beam Depth Profiling of Polyimide Films.

Wednesday, October 20, 2010 at 2:20 PM - Surface Mass Spectrometry: SIMS and Beyond Session: TOF Scientist, Dr. Scott Bryan will present Optimization of C ₆₀ Sputtering Conditions for Polymer Depth Profiling by TOF-SIMS.

For further information on these PHI presentations, including abstracts, click on the following link: events/PHI-AVS-2010-Presentations.pdf

PHI’s participation at the Platinum Sponsorship level is supporting many AVS activities including the Welcome Mixer on Monday evening, exhibit hall breaks on Tuesday and Wednesday afternoon, the Grand Prize Raffle, the ASTM E42-ASSD Tuesday Evening Workshop, and travel support for an ASSD Student. The Welcome Mixer will take place on Monday evening, October 18, 2010, from 5:30 p.m.-7:30 p.m. in “Ballroom B” of the Albuquerque Convention Center. This Mixer is a casual gathering where attendees and exhibitors can enjoy some refreshments together before the Exhibit Hall opens on Tuesday. Please stop by and say hello to your friends from PHI.

For more information regarding AVS-57 visit:  www.avs.org