Event

One-Day Workshop at Clemson University on Driving Discovery with PHI’s Lossless Parallel Imaging MS/MS

Clemson University at Clemson’s Electron Microscopy Facility in the Advanced Materials Research Laboratory in South Carolina is offering a free one-day workshop on "Driving Discovery with PHI’s Lossless Parallel Imaging MS/MS".

This workshop will be held on Wednesday, July 10, 2024 presented by former President and TOF-SIMS scientist Scott Bryan from Physical Electronics.  This workshop will be located at 91 Technology Drive, Anderson, SC. 

This one-day workshop features a seminar from 10:30-12:00 pm, followed by lunch, small group lab tours with an instrument overview from 1:00-2:30 pm.  We have a few spots left for the workshop!  If you would like to reserve your spot, please contact Kent Brown at kbrown@phi.com.

Parallel Imaging MS/MS via kilo-electron volt collision-induced dissociation (keV-CID) enables compositional identification of ions and structural elucidation of molecules in a lossless fashion during TOF-SIMS 2D/3D visualization; that is, two hyperspectral data sets are collected at every 2D/3D image pixel. What’s more, this can be accomplished at lateral resolutions of < 70 nm and for low abundance matrix components. Truly, TOF-SIMS tandem MS imaging has proven vital in numerous fields including surface modification, polymer composites, 2D materials, electronic devices, power generation and energy storage, catalysis, and bio-medicine, to name a few. This seminar will introduce the basic principles of TOF-SIMS tandem MS imaging and explore a representative cross-section of applications.

Figure 1 – An illustration of lossless Parallel Imaging MS/MS analysis and associated MS¹ and MS² data. The tandem MS data was acquired with precursor selection centered at m/z = 284.31 of the (quasi-)molecular ion. The anticorrelation observed in the MS² product ion images (i.e., m/z 60 and m/z 88) reveals the presence of two molecular components

Scott earned a B.S. degree in Chemistry from the University of Minnesota in 1982, he went on to graduate school at The University of North Carolina in Chapel Hill where he received his Ph.D. in Analytical Chemistry in 1986 under the direction of Professor Richard Linton.  His dissertation was on the development of microcomputer based digital imaging system for extending SIMS to 3D elemental analysis of materials. Upon graduation, he joined British Petroleum in Ohio as team leader of the Surface Analysis Group.  At BP America he used Auger, XPS, and SIMS to study ceramics, catalysts, polymers, and minerals.  He left BP at the end of 1993 to join Physical Electronics to work on the commercialization of the first PHI TOF-SIMS.  In 2008 he was appointed Vice President and then in 2010 promoted to President of PHI responsible for all US operations.  He retired as President in 2022 and moved to an Advisor role.  Over the past 30 years Scott has published 50 peer reviewed papers and made numerous presentations at both national and international conferences.