One-Day Workshop at Clemson University on Driving Discovery with PHI’s Lossless Parallel Imaging MS/MS

Clemson University at Clemson’s Electron Microscopy Facility in the Advanced Materials Research Laboratory in South Carolina is offering a free one-day workshop on "Driving Discovery with PHI’s Lossless Parallel Imaging MS/MS".

This workshop will be presented by Dr. Gregory L. Fisher on Tuesday, July 9, 2024 located at 91 Technology Drive, Anderson, SC. 

This one-day workshop features a seminar from 10:00-12:00 pm, followed by lunch, lab tour with an instrument overview from 1:00-2:30 pm. Register here for the free workshop.

Parallel Imaging MS/MS via kilo-electron volt collision-induced dissociation (keV-CID) enables compositional identification of ions and structural elucidation of molecules in a lossless fashion during TOF-SIMS 2D/3D visualization; that is, two hyperspectral data sets are collected at every 2D/3D image pixel. What’s more, this can be accomplished at lateral resolutions of < 70 nm and for low abundance matrix components. Truly, TOF-SIMS tandem MS imaging has proven vital in numerous fields including surface modification, polymer composites, 2D materials, electronic devices, power generation and energy storage, catalysis, and bio-medicine, to name a few. This seminar will introduce the basic principles of TOF-SIMS tandem MS imaging and explore a representative cross-section of applications.

Figure 1 – An illustration of lossless Parallel Imaging MS/MS analysis and associated MS1 and MS2 data. The tandem MS data was acquired with precursor selection centered at m/z = 284.31 of the (quasi-)molecular ion. The anticorrelation observed in the MS2 product ion images (i.e., m/z 60 and m/z 88) reveals the presence of two molecular components

Dr. Gregory L. Fisher is the Principal Scientist at Physical Electronics, and the Product & Marketing Manager for time-of-flight secondary ion mass spectrometry (TOF-SIMS). Greg earned B.S. degrees in Chemistry and Physics at the University of Wisconsin at La Crosse, and a Ph.D. at the Pennsylvania State University. Greg was at Los Alamos National Laboratory for seven years engaged in the high explosive reaction chemistry via ultrafast laser-excited spectroscopy (HERCULES) project and was part of the nuclear materials science group contributing to LANL’s nuclear materials mission. While at LANL, Greg was at the forefront of cluster ion beam development and established the use of a C60 ion beam in high sensitivity measurements of materials chemistry. Since joining PHI in 2006, an underlying theme of Greg’s work has been the development of TOF-SIMS as a practical tool for molecular and high m/z ion identification in materials, pharmaceutical, and bio-medical research with applications including restenosis, oncology and neuroplasticity. Greg’s work has led to a number of innovations and patents. A hallmark has been the development of a new mass spectrometer technology for Parallel Imaging MS/MS (TOF-SIMS tandem MS imaging) which enables the compositional and structural elucidation of molecules in a lossless fashion and with visualization at < 100 nm resolution.

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© 2024 Physical Electronics, Inc. (PHI) All Rights Reserved.