Event
ECASIA'09
13th European Conference on Applications of Surface and Interface Analysis
ECASIA'09
Physical Electronics continues to be a proud sponsor of the European Conference on Applications of Surface and Interface Analysis. This 13th ECASIA meeting is being held in the beautiful resort city of Antalya in Turkey. Members of our technical and sales staff will be present at our booth in the exhibition hall and attending conference events. We look forward to having the opportunity to renew friendships and discuss PHI’s surface analysis products with you.
In the technical sessions on Tuesday afternoon John Hammond will present "Metrics for Polymer Depth Profiling with XPS and C60 Ion Sources ", and Sankar Raman will present " Nanocone Chemical Analysis with Scanning Auger Microscopy" . We hope you will attend these presentations to learn about some of the latest developments at PHI.
In our booth we will be announcing our new Scanning Auger Nanoprobe the PHI 700Xi. Please stop by our booth to learn about this exciting new instrument. Our technical staff will also be available to show you the newest features in PHI MultiPak and to demonstrate the VersaProbe Multi-Technique XPS instrument in our demonstration laboratory via the internet. We look forward to seeing you in Antalya.
For more information about the conference visit the ECASIA'09 conference website at: www.ecasia09.org/