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PHI's European/EMEA Workshop

Join us to learn recent developments and explore applications in applied surface analysis. The two days will be filled with invited speakers, live Q&A, and other highlights from our customers and PHI lab scientists. The workshop is free to attend.

March 2 & 3

3 p.m. - 5 p.m. Central European Time (CET) each day

8 a.m. - 10 a.m. (CST) each day 

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Workshop topics will include talks on sample preparation, application of XPS, AES and TOF-SIMS for fundamental and applied research, use of correlative surface analysis utilizing PHI USA instruments and advances in data collection and processing.

European/ EMEA Workshop Agenda

March 2 

3:00-3:10 John Newman, PHI USA – “Welcome and What’s New at PHI”

3:10-3:35 Liza Coetsee-Hugo, University of the Free State–  “Application of AES and XPS”

3:35-4:00  Emmy Yu Cao, Chalmers University of Technology– “Application of XPS and AES for Materials Characterization at Chalmers”

4:00-4:25  Jules Galipaud, Ingénieur CNRS – “Successes and challenges in the investigation of tribological systems by surface analysis” 

4:25-4:50  Saurabh Lodha, IIT Mumbai – “Thin Film XPS and UPS Studies for Semiconductor Device Applications”

4:50-5:00 Ashley Maloney, PHI USA – “Multi-technique AES: The complementary nature of AES, FIB, EDS, and EBSD”

March 3 

3:00-3:05 Jenny Mann, PHI USA – “Welcome” 

3:05-3:15 Ben Schmidt, PHI USA–  “Application of a Laboratory-Based Scanning XPS/HAXPES Instrument for the Characterization of Buried Interfaces​” 

3:15-3:40  Olivier Renault, CEA LETI – “Lab-scale Hard X-ray Photoelectron Spectroscopy (HAXPES): application to buried interfaces in device technology”

3:40-4:05  Lars Jeurgens, EMPA– “Advanced chemical state analysis by lab-based XPS/HAXPES ” 

4:05-4:30 Joachim Sann, Giessen University – “XPS on battery materials – hurdles and caveats”

4:30-4:55 Jean-Paul Barnes, CEA LETI – “Correlative TOF-SIMS and XPS analysis for nano and optoelectronic applications”

4:55-5:05 Greg Fisher, PHI USA – “New developments and applications using TOF-SIMS”

5:05-5:10 Wolfgang Betz, PHI USA – “Adjourn message”

Agenda posted in Central European Time (CET)

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© 2021 Physical Electronics, Inc. (PHI) All Rights Reserved.