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M & M 2013

August 4 - 8, 2013

Indiana Convention Center - Indianapolis, IN

www.microscopy.org/MandM/2013/index.cfm

Physical Electronics is proud to attend the 2013 Microscopy and Microanalysis meeting and exhibition, August 4 - 8, 2013 in Indianapolis, Indiana . Please visit us in booth #836 to learn about our AES, XPS and TOF-SIMS surface analysis instrumentation.

We invite you to attend a talk given by Dr. John Hammond of Physical Electronics titled FIB-TOF Tomography of Solid Oxide Fuel Cells on Tuesday, August 6 @ 2:30 pm in Room 243.


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© 2021 Physical Electronics, Inc. (PHI) All Rights Reserved.