M & M 2013
August 4 - 8, 2013
Indiana Convention Center - Indianapolis, IN
www.microscopy.org/MandM/2013/index.cfm
Physical Electronics is proud to attend the 2013 Microscopy and
Microanalysis meeting and exhibition, August 4 - 8, 2013 in Indianapolis, Indiana . Please visit us in booth #836 to learn about our AES, XPS and TOF-SIMS surface analysis instrumentation.
We invite you to attend a talk given by Dr. John Hammond of Physical
Electronics titled FIB-TOF Tomography of Solid Oxide Fuel Cells on Tuesday, August 6 @ 2:30 pm in Room 243.
