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2022 International Conference on Secondary Ion Mass Spectrometry (SIMS 23)

Physical Electronics is a proud sponsor of the 2022 International Conference on Secondary Ion Mass Spectrometry (SIMS 23) being held in Minneapolis, MN.  Please visit us at our booth on the exhibition floor to learn from our staff what is new at PHI and plan to attend technical presentations by our scientists in the technical symposia and poster sessions.

There will be several scientific presentations by Physical Electronics & ULVAC-PHI scientists being presented throughout the week.

Dr. Greg Fisher - Characterization of Surface Bonding and Molecular Structure from Click-Chemistry to Biogenesis Using Tandam Mass Spectrometry Imaging

Dr. Shin-ichi Iida - Sample Processing by Bi-FIB for TOF-SIMS Imaging of Buried Interfaces

Dr. Hsun-Yun Chang - Surface Characterization of High Entropy Alloys with Sea Water and Sulfic Acid Corrosion Test Using Hard X-ray Photoelectron Spectroscopy and Time-of-Flight Secondary Ion Mass Spectroscopy

Dr. Tomomi Ohashi - Basic Evaluation and Impurity Analysis in OLED Devices with New Ion Guns for Dynamic-SIMS

Learn more about SIMS23.

18725 Lake Drive East, Chanhassen, MN 55317
© 2022 Physical Electronics, Inc. (PHI) All Rights Reserved.
© 2022 Physical Electronics, Inc. (PHI) All Rights Reserved.