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PHI Electron Spectroscopy Workshop at Stanford University

Day 1 will feature local presenters highlighting recent work in the surface analysis field with a focus on the application of the most common electron spectroscopy techniques, X-ray Photoelectron Spectroscopy and Auger Electron Spectroscopy. This will be followed by an update of XPS and AES instrumentation technology and a review of unique features of Stanford's systems that allow for the study of heterogeneous materials, and end with a tour of the surface analysis laboratory at the Stanford Nano Shared Facilities.

NOTE: Attendees are invited to contribute a short 15 minute presentation during the workshop (optional). Topics should be focused on XPS and/or AES techniques and applications in surface science and engineering, and could be method development oriented that would be of general interest to other users.

Day 2 is a MultiPak XPS data processing workshop, and will cover common data massage methods used in processing XPS results.

 

REGISTRATION CLOSED

Tuesday, April 24

PHI Electron Spectroscopy Workshop (Free to all attendees)

HEPL Conference Room 102/103

09:00 a.m. - 12:00 p.m. Morning Session - User Base Presentations

XPS and AES Techniques in Surface Science and Engineering 

 

09:00 a.m. - Welcome and Introductions

09:20 a.m. - Probing Diffusion of Metal and Halide Species in Perovskite Solar Cells Using XPS

Caleb Boyd, Stanford University

09:40 a.m. - Silicon Nitride Thin Films Re-visited

Ercan Adem, Cypress Semiconductor

10:00 a.m. - The Case for Complementary Surface Analysis Techniques: When is XPS not Enough?

Saad Alnabulsi, Physical Electronics

10:20 a.m. - Break

10:40 a.m. - XPS and Auger Characterization of ALD Thin Films

Olivia Hendricks, Stanford University

11:00 a.m. - Thin Film Interface Analysis

Yuri Uritsky

11:20 a.m. - Fundamental Issues with Relative Sensitivity Factors in XPS

Christopher Brundle - CR Brundle and Associates

11:40 a.m. - Fundamental Issues with Relative Sensitivity Factors in XPS

Wei Liu - NXP

12:00 p.m. – 01:00 p.m. - Complimentary Lunch Provided 

01:00 p.m. – 4:00 p.m. Afternoon Session –Technology Update

Advances in XPS and AES Technology

01:00 p.m. - Presentation: Scanning XPS micro-Scale Analysis and Applications

01:40 p.m. - Presentation: AES nano-Scale Analysis Technique and Applications

02:20 a.m. - Break

02:40 p.m. – 4:00 p.m. Surface Analysis Lab Tour and Instrument Q&A


Wednesday, April 25

PHI MultiPak XPS Data Processing Workshop - REGISTRATION FULL

(Free to Stanford University students, faculty, and staff)

Yang and Yamazaki Environment and Energy Building (Y2E2) Room 300

This workshop will help gain an understanding of the data massage software's user interface, and routine methods for processing all available data types generated in XPS.

09:00 a.m. - 12:00 p.m. Morning Session

  • MultiPak and Software Setup
  • User Interface overview and basic settings
  • Handling Data files
  • Spectral Analysis
    • Atomic Concentration
    • Peak Identification
    • Quantification
    • Smoothing
  • Basic Chemical Analysis
    • Charge referencing
    • Chemical state identification
  • Introduction to spectral curve fitting

12:00PM - 01:00PM - Complimentary Lunch Provided

01:00PM - 04:00PM - Afternoon Session

  • Spectral curve fitting continued
  • Linear Least Squares Fitting
  • Spectral Deconvolution
  • Depth Profiling Data Reduction
    • Extract Spectra
    • Depth Calibration
    • Chemical Analysis
    • Quantification
  • Map Data Reduction
    • Extract Intensity Line
    • Extract Spectra
    • Chemical Analysis
    • Quantification
  • Report Generation

REGISTRATION CLOSED

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© 2021 Physical Electronics, Inc. (PHI) All Rights Reserved.