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Hints and Methods for Use of Tandem MS in TOF-SIMS Data Reduction, Interpretation and Peak Identification Webinar

Presented by Greg Fisher, Ph. D., Principal Scientist

Time-of-flight secondary ion mass spectrometry (TOF-SIMS) has numerous unique attributes including high sensitivity for low abundance components, high surface selectivity, short duty cycle for rapid imaging, high spatial resolution, depth profiling and 3D imaging. PHI has introduced a lossless Parallel Imaging MS/MS instrument that combines the power of tandem MS (MS2) imaging for ion peak identification with the above-mentioned attributes of TOF-SIMS (MS1) imaging.

A common discussion with TOF-SIMS users and customers concerns data reduction and interpretation. Specifically, how does one recognize the salient bits of data from the complex set of MS imaging data that often has a peak at every mass scale unit. Then, how does one accurately and unambiguously identify the atomic composition of the peak(s) in question. This webinar will provide helpful hints and guidance to recognize peaks of interest, and demonstrate the approach used for confident identification of those peaks.

Registration here for webinar.

Figure 1 – An illustration of lossless Parallel Imaging MS/MS analysis and associated MS1 and MS2 data. The tandem MS data was acquired with precursor selection centered at m/z = 284.31 of the (quasi-)molecular ion. The anticorrelation observed in the MS2 product ion images (i.e., m/z 60 and m/z 88) reveals the presence of two molecular components.

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© 2022 Physical Electronics, Inc. (PHI) All Rights Reserved.