Event
PHI's Virtual Fall Workshop
Join us to learn recent developments and explore applications in applied surface analysis. The three days will be filled with invited speakers, live Q&A, and other highlights from our customers and PHI lab scientists.
Workshop topics will include talks on sample preparation, application of XPS, AES and TOF-SIMS for fundamental and applied research, use of correlative surface analysis utilizing PHI USA instruments and advances in data collection and processing.
Fall Workshop Agenda
Nov. 17 10 a.m-Noon
10:00-10:20 John Newman, PHI USA – “Welcome and what’s new at PHI”
10:20-10:45 Ashley Maloney, PHI USA – “AES Analysis of Area Selective Deposition Selectivity Loss in Atomic Layer Deposition/Atomic Layer Etching Supercycles”
10:45-11:10 Anja Vanleenhove, IMEC, Belgium – “Buried Interface and Buried Film Analysis Using Lab-Scale HAXPES Instrument”
11:10-11:35 Nathaniel Rieders, Montana State University – “New Insights into Sulfide Inclusions in 1018 Carbon Steels”
11:35-12:00 Alberto Herrera, CINVESTAV-Queretaro, Mexico – “Three Issues Related to XPS Data Acquisition: Angular Aperture for ARXPS, "Magic" Angle, and Data Alignment”
Nov. 18 10 a.m.-Noon
10:00-10:05 – Welcome and agenda
10:05- 10:30 Derrick M. Poirier, 3M, USA – “Using Post-it© Notes to Prevent LaB6 Deactivation”
10:30-10:55 Fred Stevie, North Carolina State University, USA – “Sample handling, preparation and mounting for XPS and other surface analytical techniques”
10:55-11:20 Bill Stickle, HP, USA – “Surface Chemical Microanalysis”
11:20-11:45 Sebastiaan Van Nuffel, Penn State University, USA – “Biological ToF-SIMS”
11:45-12:10 Robert Hamers, University of Wisconsin Madison, USA – “XPS and UPS studies of chemically functionalized diamond surfaces”
Nov. 19 10 a.m.-Noon
10:00-10:05 – Welcome and agenda
10:05-10:30 Zhongrui Li, University of Michigan, USA – “Oxidation state effects on the Auger transitions in 3d transition-metal compounds”
10:30-10:55 Jennifer Mann, PHI USA – “XPS Depth Profiling of Metal-Halide Perovskites”
10:55-11:20 Peng Li, University of Alberta, Canada – “VersaProbe III - A Versatile Scanning XPS system for a Core-Facility- XPS”
11:20-11:45 Anass Benayad, CEA, Liten, France – “From Post-Mortem to Operando XPS, A New Approach for Lithium/Electrolyte Interface Study”
11:45:12:00 Greg Fisher, PHI USA – “New developments and applications using TOF-SIMS”