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PHI's Virtual Fall Workshop

Join us to learn recent developments and explore applications in applied surface analysis. The three days will be filled with invited speakers, live Q&A, and other highlights from our customers and PHI lab scientists.

November 17, 18, 19    
10 a.m. - Noon (CST) each day
REGISTER HERE

Workshop topics will include talks on sample preparation, application of XPS, AES and TOF-SIMS for fundamental and applied research, use of correlative surface analysis utilizing PHI USA instruments and advances in data collection and processing.  

 

Fall Workshop Agenda

Nov. 17  10 a.m-Noon 

10:00-10:20 John Newman, PHI USA – “Welcome and what’s new at PHI” 

10:20-10:45 Ashley Maloney, PHI USA – “AES Analysis of Area Selective Deposition Selectivity Loss in Atomic Layer Deposition/Atomic Layer Etching Supercycles”  

10:45-11:10 Anja Vanleenhove, IMEC, Belgium –  “Buried Interface and Buried Film Analysis Using Lab-Scale HAXPES Instrument” 

11:10-11:35 Nathaniel Rieders, Montana State University – “New Insights into Sulfide Inclusions in 1018 Carbon Steels” 

11:35-12:00 Alberto Herrera, CINVESTAV-Queretaro, Mexico – “Three Issues Related to XPS Data Acquisition: Angular Aperture for ARXPS, "Magic" Angle, and Data Alignment” 

Nov. 18  10 a.m.-Noon 

10:00-10:05 – Welcome and agenda 

10:05- 10:30 Derrick M. Poirier, 3M, USA – “Using Post-it© Notes to Prevent LaB6 Deactivation” 

10:30-10:55 Fred Stevie,  North Carolina State University, USA – “Sample handling, preparation and mounting for XPS and other surface analytical techniques”

10:55-11:20 Bill Stickle, HP, USA – “Surface Chemical Microanalysis” 

11:20-11:45 Sebastiaan Van Nuffel, Penn State University, USA – “Biological ToF-SIMS” 

11:45-12:10 Robert Hamers, University of Wisconsin  Madison, USA – “XPS and UPS studies of chemically functionalized diamond surfaces” 

Nov. 19 10 a.m.-Noon 

10:00-10:05 – Welcome and agenda 

10:05-10:30 Zhongrui Li, University of Michigan, USA –  “Oxidation state effects on the Auger transitions in 3d transition-metal compounds” 

10:30-10:55 Jennifer Mann, PHI USA  – “XPS Depth Profiling of Metal-Halide Perovskites” 

10:55-11:20 Peng Li, University of Alberta, Canada –  “VersaProbe III - A Versatile Scanning XPS system for a Core-Facility- XPS” 

11:20-11:45 Anass Benayad, CEA, Liten, France – “From Post-Mortem to Operando XPS, A New Approach for Lithium/Electrolyte Interface Study” 

11:45:12:00 Greg Fisher, PHI USA – “New developments and applications using TOF-SIMS” 

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© 2020 Physical Electronics, Inc. (PHI) All Rights Reserved.