PHI Introduces 710 Scanning Auger Nanoprobe
Physical Electronics unveiled its latest innovation in scanning Auger, the PHI
710
Scanning Auger Nanoprobe, at the American Vacuum Society’s
59th International Symposium and Exhibition held in Tampa, Florida, October 28 - November 2, 2012. With the new technology users will experience
improved secondary electron imaging performance and improved chemical state imaging capabilities.
The
710
is the next generation in scanning Auger and features new electronics that contribute to reduced beam size and enable remote diagnostic
capabilities, as well as providing a smaller footprint. The
710
maintains the core capabilities of PHI cylindrical mirror analyzer (CMA) based Auger instruments yet provides the ability to obtain high energy
resolution spectra when they are needed. The CMA provides coaxial analyzer and electron gun geometry enabling high sensitivity over a broad range
of collection angles to facilitate the complete characterization of the three dimensional structures that are the basis for most nanoscale
technology development.
