PHI Genesis Scanning XPS/HAXPES Microprobe
- A fully automated multi-technique scanning XPS/HAXPES microprobe
PHI 710 Scanning Auger Nanoprobe
- A scanning Auger instrument optimized for high magnification chemical imaging
PHI nanoTOF 3 Time-of-Flight SIMS
- A TOF-SIMS instrument optimized for the highest sensitivity elemental and molecular analysis
Refurbished Factory Certified Refurbished Instruments
- Performance to Original Specifications
- Same 1-year Warranty as New Instruments
- Prices Include Installation, Warranty and Training