PHI Introduces nanoTOF II
Physical Electronics introduced its new TOF-SIMS instrument, the
nanoTOF
II
, at the American Vacuum Society’s
61st International Symposium and Exhibition held in Baltimore, Maryland, mid-November. The new instrument features improved evolutionary technology
setting it apart from its competition.
Notable changes include updates to the analyzer technology, primary excitation sources, sputter depth profiling sources and the Zalar rotation
module. In addition, the new instrument software allows enhanced system control and data reduction. With advancements to both the hardware and
software functions, users of the nanoTOF II will experience increased analysis speed and find the system significantly easier to use.
