Introducing NEW PHI nanoTOF 3

Parallel Imaging MS/MS

TOF-SIMS Tandem MS Imaging

The 7th Generation of TOF-SIMS from PHI

  • NEW sleek appearance, ergonomic design, reduced footprint, and reduced power consumption
  • NEW fully automated stage design with in-vacuum parking for reliable, high-throughput sample handling
  • NEW bismuth LMIG cluster ion emitter with improved spatial resolution

Reliable automation and remote operation

  • Highly configurable queuing system for automated unattended analysis and maximum efficiency
  • Fully remote operation and advanced remote diagnostics

Patented Turn-Key Dual-Beam Charge Neutralization

  • NEW combination of pulsed low-energy electrons and low-energy Ar+ ions for robust and truly turn-key insulator analysis in both +ve and -ve ion polarities

Patented Parallel Imaging MS/MS Spectrometer

  • Flat and rough samples alike are easily analyzed by the 7th generation of PH l's triple-focus mass analyzer
  • Parallel Imaging MS/MS takes TOF-SIMS peak identification from "I think" to "I know!"
  • Lossless and high sensitivity tandem MS analysis of peaks down to < 20 ppm abundance

18725 Lake Drive East, Chanhassen, MN 55317
© 2024 Physical Electronics, Inc. (PHI) All Rights Reserved.
© 2024 Physical Electronics, Inc. (PHI) All Rights Reserved.