Article
Introducing NEW PHI VersaProbe 4
October 25, 2021
Scanning XPS Microprobe
Improved spectroscopic performance
- High sensitivity in small and large area analysis using micro-focused, scanning X-ray source
NEW Large area imaging and mapping
- X-ray induced Secondary Electron Imaging (SXI) for large area navigation
- Large area chemical mapping
~ 25 x 2.5 mm SXI mosaic for selecting analysis locations with 100% certainty
~ 5 x 2.5 mm C1s (red) and Al 2p (blue) chemical map overlayed
High performance depth profiling
- Multiple ion gun options for a variety of organic, inorganic, and mixed materials
- Advanced software for thin film structure analysis
Reliable automation and remote operation
- Highly configurable queuing system for automated unattended analysis and maximum efficiency
- Fully remote operation and advanced remote diagnostics
Environmentally friendly modern configuration
- Efficient power consumption, faster pump-down and ergonomic design
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© 2024 Physical Electronics, Inc. (PHI)
All Rights Reserved.
© 2024 Physical Electronics, Inc. (PHI)
All Rights Reserved.