Hard Disk Thin Film Composition - Multitechnique

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PHI XPS, AES, and TOF-SIMS instruments can be used to confirm or explore the construction of magnetic storage media and many other thin film structures. Shown below is an XPS sputter depth profile obtained using a monatomic argon ion source for sputtering. Note the ability to observe multiple ultra thin layers of varying composition and observe the presence of oxygen at a few of the interfaces.

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© 2024 Physical Electronics, Inc. (PHI) All Rights Reserved.