Organic Photovoltaics

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The complex chemistry of organic photovoltaic films make PHI TOF-SIMS instruments an attractive option for compositional characterization of these films. Using an argon gas cluster ion beam for sputtering and a liquid metal ion gun for analysis, characteristic mass fragments of the various materials in the complex film structure are observed.

TOF-SIMS sputter depth profile of an organic photovoltaic film structure showing the ability to observe characteristic mass fragments of the organic materials and create a detailed compositional depth profile.

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© 2020 Physical Electronics, Inc. (PHI) All Rights Reserved.
© 2020 Physical Electronics, Inc. (PHI) All Rights Reserved.